AnshuSarje, Martin PeckerarEffect of Radiation & HEI on Flicker noise in 0.5 CMOS transistor2018 IEEE International Conference on Electronics, Computing and Communication Technologies CONECCT
Education Profile
Ph.D from from University of Maryland,
USA in 2013.
MS from University of Maryland,
USA in 2010.
MSE from John Hopkins University, Baltimore,
USA in 2005.
B.Tech from IIT Roorkre, Uttarakhand,
India in 2003.
Professional Profile
Visiting Assistant Professor ,
at IIIT Hyderabad from 2019- Present
Technical Consultant ,
Global Technical Catalyst till 2019
Product/ Test Engineer ,
Product/ Test Engineer Texas Instruments Pvt Ltd, Bangalore , India
Process development Engineer ,
PTD Intel Corporation, Hillsboro 2016
Graduate Research Assistant Mixed Signal Lab/information & Biomorphic System Lab ,
University of Maryland, USA
Scientific and Professional Memberships
NA.
Awards
Intel recognition ‘Heros of Tomorrow’ for driving task force to achieve yield improvement in a multi-chip packageproduct, in short time. Intel, Hillsboro, Oregon, USA, Feb 2016.